Equipment

Dual FIB with UHREM SEM

Fib_s_equipment Ampliar

Description

Helios 450S (FEI) - Workstation combining Scanning Electron Microscope and Focused Ion Beam for nanoprototyping, nano-machining, nano-analysis and advanced sample preparation. Simultaneously images are achieved with the electron beam at ultra-high resolution using a Schottky field emitter while at the same time thinning with the ion beam using a liquid Gallium ion emitter.

Available for external use