X-Ray Photoelectron SpectroscopyAmpliar
Thermo Scientific Escalab 250 Xi is an analytical X-Ray Photoelectron Spectroscopy (XPS) system with multi-technique capability (UPS/REELS/ISS) able to produce high-resolution spectra for quantitative surface analysis of areas between <20 µm and >2 mm in size. Spectroscopic surface characterization is complemented by the ability to produce elemental or chemical maps with lateral resolution of <10 µm and to perform depth profiling both non-destructively (using angle-resolved XPS) and destructively (using ion beam sputtering). The system is equipped with a Monatomic and Gas Cluster Ion Source (MAGCIS), which can produce beams of monoatomic Argon ions or ionized clusters of Argon atoms. MAGCIS thus enables depth profiling of inorganic/solid materials and of biological/organic or other soft materials. The cluster ion mode of MAGCIS also provides an option for removing adventitious contamination with minimal damage to the underlying material.