X-ray Thin Film/Reflectometry

Xrd_diffractometer_s_equipment Ampliar


PanAnalytical X Pert PRO MRD system - An X-Ray Diffractometer, a non-destructive technique used for analytical tasks such as grazing incidence, in-plane diffraction, reciprocal space mapping, reflectometry, and small-angle scattering for thin film research; studying layer thickness, lattice constants, lattice mismatch, periodicity, mosaic spreads, lattice stress and strain, composition, etc. Applications include optics, nanotechnology storage media, polymers, metals, minerals, catalysts, plastics, pharmaceuticals, thin-film coatings, ceramics, and semiconductors.

Available for external use