Equipment

Atomic Force Microscope - Materials

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Description

Bruker Dimension Icon with Scan Assyst - The AFM system has been designed from top to bottom to deliver the revolutionary low drift and low noise that allows users to achieve artifact-free high-quality images in minutes. The Dimension Icon AFM is equipped with proprietary ScanAsyst™ automatic image optimization technology, which enables easier, faster, and more consistent results. With the NanoScope V Controller, the Dimension Icon is able to display and capture up to eight images simultaneously with a signal-to-noise ratio. This fifth-generation controller delivers high-speed data capture and high-pixel-density images (5120 x 5120) in eight channels simultaneously, allowing researchers to record and analyze tip-sample interactions that probe nanoscale events at time scales.

Available for external use

Associated technology

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