Equipment
Dimension Icon Atomic Force Microscope
Description
The dimension icon AFM system has been designed from top to bottom to deliver the revolutionary low drift and low noise that allows users to achieve artifact-free high-quality images in minutes. The Dimension Icon AFM is equipped with proprietary ScanAsyst™ automatic image optimization technology, which enables easier, faster, and more consistent results. With the NanoScope V Controller, the Dimension Icon is able to display and capture up to eight images simultaneously with a signal-to-noise ratio. This fifth-generation controller delivers high-speed data capture and high-pixel-density images (5120 x 5120) in eight channels simultaneously, allowing researchers to record and analyze tip-sample interactions that probe nanoscale events at time scales.




