Environmental Scanning Electron Microscope (ESEM)

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The Quanta 650 FEG (FEI) is a field emission scanning electron microscope capable of generating and collecting all available information from any type of sample material: it is the most versatile high-resolution low-vacuum FEG SEM with extended low-vacuum capabilities for really challenging samples and for dynamic experiments.
The Quanta 650 FEG can freely and simply be switched between three vacuum modes, which enables the investigation of conductive, non-conductive and high-vacuum incompatible materials:
High-vacuum mode (<6*10-4 Pa) for imaging and microanalysis of conductive and/or conventionally prepared specimens; Low-vacuum mode (10 to 130 Pa) for imaging and microanalysis of non-conductive specimens without preparation; and ESEM mode (130 to 2600 Pa) for high-vacuum incompatible specimens which are impossible to investigate with traditional electron microscopy methods and for dynamic experiments. With the Peltier stage it is possible to cool samples between 0 and 10 °C, thus specimens of very diverse nature can be imaged and analyzed at relative humidity conditions of up to 100% (typical chamber pressures required are in the range 300-1000 Pa). In-situ freeze-drying can be performed when the temperature range of the Peltier stage is set below 0°C with a minimum of –20 °C. The Peltier stage can also heat the sample up to ~60°C. For the dynamic heating experiments, a 1500 ºC heating stage as well as a 1000 ºC heating stage enables experiments on the in-situ morphological sample changes during heating. In the case of the dynamic experiments the temperature and the ramp-up profile are directly controlled through the Quanta user interface.

Available for external use