Small Angle X-ray Scattering (SAXS)

S_equipment Ampliar


Anton Paar SAXSess mc2 - Small-angle X-ray Scattering is a non-destructive method in which the incoming X-ray beam interacts with the electrons of all atoms in the sample, resulting in a so-called “scattering pattern” (X-ray intensities vs scattering angles). From such a pattern, we can derive information on characteristic sizes, shape, internal structure, cristallinity and porosity of nanomaterials.
The X-ray source is sealed-tube type (line and point collimation). The optics consists of a focusing graded multilayer mirror. The equipment includes TCS temperature-controlled (-150 °C to 300 °C; ± 0.1 °C) and GISAXS sample stages. Liquids, solids and pastes can be measured. A flow cell is also available for automatic measurements and reaction monitoring. The X-ray detector is image-plate type for 2D data acquisition. The measurable scattering vector range is 0.03 nm-1 -28 nm-1, corresponding to a Bragg distance (d) range 200 nm > d > 0.1 nm..

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