Ultrahigh vacuum scanning probe microscope

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The Omicron VT-AFM XA 50/500 is a scanning probe microscopy instrument operating under ultrahigh vacuum conditions. It´s capabilities include atomic force microscopy, scanning tunneling microscopy and Kelvin probe force microscopy, operation in the temperature range between ~20K up to 500 K. The scan range is 10*10 μm. Several light sources are available for measurements under sample illumination. The vacuum system counts on a manipulator with direct and resistive sample heating and Ar-sputtering. A LEED/Auger extension provides information about surface crystal structure and chemical composition

Available for external use