Combined QCM-D and Ellipsometry SystemAmpliar
A combination of Q-Sense E1 and Woollam M-2000 instruments provides capabilities for separate or simultaneous Quartz Crystal Microbalance with Dissipation (QCM-D) and Spectroscopic Ellipsometry (SE) measurements. QCM-D follows adsorption of analytes onto quartz sensors, which are available with a wide variety of coatings. Dissipation information from QCM-D also enables characterization of interactions between the adsorbates and the solvent, from which parameters such as viscosity/elasticity and conformation of the adsorbed layer can be inferred. Q-Sense E1 system is equipped with temperature control stage (158 to 645 °C) and a four-channel peristaltic pump. SE provides information about the thickness and optical parameters of the adsorbed layer. M-2000 system is equipped with an automated variable-angle (44° to 90°) base and a multi-channel detector that measures 390 wavelengths between 370 and 1000 nm. Simultaneous QCM-D and SE measurements are carried out by placing a QCM-D cell equipped with optical ports onto a special mount of the SE system.