Nanoelectronics Characterization of Nanostructures for Solar Cells
We use ultrahigh vacuum scanning probe microscopy (UHV-SPM) methods to characterize the physical properties of chalcopyrite nanostructures and solar cell materials on the nanoscale.
Scanning probe methods include regular atomic force microscopy, Kelvin probe force microscopy, surface photovoltage measurements and scanning tunneling microscopy. We are especially interested in the interaction of light with solar cell materials at the nanoscale.
Scanning probe microscopy system