Nanoelectronics Quantitative Electron Microscopy
The Quantitative Electron Microscopy group at INL is focused on the extraction of relevant information from nanostructures in order to improve their use in diverse technological fields. For this, its members explore various Transmission Electron Microscopy (TEM) techniques in combination with theoretical calculations and results from additional characterization tools. Its general goal is to gain insight on nanomaterials’ structure and properties, amassing then knowledge to improve their performance. Typical research subjects include catalysis, energy-harvesting and microelectronic applications.
The group’s research activities can be separated in two main subgroups:
Analytical Microscopy – This subgroup explores imaging and spectroscopy techniques related to TEM to extract fundamental information about nanomaterials. This includes the determination of morphology and chemical composition with high spatial resolution. Typical outputs comprise the measurement of specific surface areas, elemental distribution and local electronic properties.
Theoretical Microscopy – This subgroup supports the analysis of more intricate systems, where careful data treatment and modeling are necessary to extract reliable quantitative information at nanoscale. This includes the processing of data with low signal-to-noise ratio, typical from beam-sensitive materials and from attempts to localize and identify single-atom dopants. Typical activities comprise the construction of atomic models and image simulation, spectra filtering and data classification through statistical analysis.
Group manager Daniel G. Stroppa