ADVANCED ELECTRON MICROSCOPY
DESCRIPTION
The Advanced Electron Microscopy, Imaging and Spectroscopy (AEMIS) Facility is a core multi-user facility that features cutting-edge instrumentation, techniques and expertise required for the characterization of samples in the physical and life sciences. The facility focuses on materials and biological research, development of novel techniques and instrumentation, as well as providing training, technical support and consultation in the areas of electron microscopy and spectroscopy. The center facility houses several electron microscopes that can probe the physical, electronic and chemical structure of matter down to the atomic scale. These instruments are coupled with advanced in-situ holders, in which the environment is controlled to match near-realistic conditions of operation, and the sample’s behavior is recorded dynamically in real time. State-of-the-art support facilities also are available including standard specimen preparation equipment and an image analysis laboratory.
INSTRUMENTATION
Transmission Electron Microscopy
Probe-Corrected FEI Titan G2 80-200 kV ChemiSTEM
Double-Corrected FEI Titan G3 Cubed Themis 60-300 kV
JEOL JEM 2100 80-200 kV
Scanning Electron Microscopy
FEI Helios NanoLab 450S DualBeam – FIB with UHREM FEG-SEM
FEI Quanta 650 FEG Environmental SEM (including Peltier and Heating Stage)
In Situ TEM Holders
1 FEI MEMS-based TEM heating and electrical holder
2 Gatan Cryo-TEM holders (FEI and JEOL microscopes)
Sample Preparation for Electron Microscopy
Vitrobot Mark IV
Plasma Cleaner Fischione 1020
Automated Critical Point Dryer Leica EM CPD300
Decontamination Chamber
Turbo Pumping Station Gatan 655
Ultrasonic Bath Branson 1800
Hotplate Stirrer Benchmark H4000-HSE
2 Desiccators
Cold Stage Controller Gatan SmartSet 900
5 Optical Microscopes:
Stereomicroscope Leica EZ4 (at FEI Titan Cubed Themis)
Stereomicroscope Leica EZ4 (at JEOL JEM 2100)
Stereomicroscope Nikon SMZ1000 (at FEI Titan ChemiSTEM)
Stereomicroscope Nikon SMZ 745 (at FEI Quanta)
Stereomicroscope Nikon SMZ 745 (at FEI Helios)
Software for Imaging Analysis
Digital Micrograph
Megacell
Vesta
Dr. Probe
Seg 3D
Serial EM
True Image
Esprit
INCA
Aztec
Inspect 3D
Amira
X-ray Photoelectron Spectroscopy
Thermo Scientific Escalab 250 Xi
OUR CATALOGUE
Is your service/project in the field of Nanoelectronics? Check how Ascent+ can support you to access our Facilities
Free access to our nanocharacterization facilities can be supported as a user project via NFFA-Europe | Pilot
For more information please contact:
Prof Paulo Ferreira
Scientific Coordinator of Advanced Electron Microscopy Facility
Research Engineer
Ana Malheiro
Research Engineer